Growth dynamics and light scattering of gold nanoparticles in situ synthesized at high concentration in thin polymer films

• Corentin Guyot,
• Philippe Vandestrick,
• Ingrid Marenne,
• Olivier Deparis and
• Michel Voué

Beilstein J. Nanotechnol. 2019, 10, 1768–1777, doi:10.3762/bjnano.10.172

• studied by measuring the bi-directional reflection distribution function. In parallel with the observation of enhanced scattering, imaging ellipsometry in dynamics mode showed that local values of the ellipsometric angles Ψ and Δ were strongly modified by the annealing process. Conclusion: A diffraction

• regimes in the dynamics of the nanoparticle growth and in the optical response of the nanocomposite. Keywords: gold; imaging ellipsometry; metal nanoparticles; plasmonic nanocomposite; polymer films; Introduction Over the last 20 years, numerous studies were carried out to investigate the optical

• the in situ growth of NPs. For this purpose, we performed the annealing of Au3+-doped PVA films and we quantified the scattering of light that is induced by the AuNP growth. We monitored the evolution of the locally resolved optical properties of the film using imaging ellipsometry (IE) and determined

An ellipsometric approach towards the description of inhomogeneous polymer-based Langmuir layers

• Falko O. Rottke,
• Burkhard Schulz,
• Klaus Richau,
• Karl Kratz and
• Andreas Lendlein

Beilstein J. Nanotechnol. 2016, 7, 1156–1165, doi:10.3762/bjnano.7.107

• -Liebknecht-Straße 24–25, 14476 Golm, Germany 10.3762/bjnano.7.107 Abstract The applicability of nulling-based ellipsometric mapping as a complementary method next to Brewster angle microscopy (BAM) and imaging ellipsometry (IE) is presented for the characterization of ultrathin films at the air–water

• interface, Brewster angle microscopy (BAM) is a well-established technique to visualize the topography of a layer [7], but it is also possible to use imaging ellipsometry (IE) [8]. Both are classical imaging techniques with respect to the principle of simply visualizing reflection intensities. Indeed, this

• Ni are the Cauchy coefficients with N2 = 0. Brewster angle microscopy and imaging ellipsometry Both BAM and ellipsometric images on a ROI with a maximum area of 500 × 400 µm2 were obtained by the nanofilm_ep3 ellipsometer. A 658 nm class IIIB laser source in combination with a ×10 magnification lens

Investigating organic multilayers by spectroscopic ellipsometry: specific and non-specific interactions of polyhistidine with NTA self-assembled monolayers

• Ilaria Solano,
• Pietro Parisse,
• Ornella Cavalleri,
• Federico Gramazio,
• Loredana Casalis and
• Maurizio Canepa

Beilstein J. Nanotechnol. 2016, 7, 544–553, doi:10.3762/bjnano.7.48

• systems. In [37], about mixed layers of bis-NTA thiols with inert OEG thiols, the authors thoroughly reported on imaging ellipsometry measurements at a single wavelength. They exploited variations of Δ and Ψ to obtain information about the thickness and homogeneity of the mixed layers while their